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Handbook of Radiation Effects - Second Edition

Andrew Holmes-Siedle
Owner of REM Oxford Ltd. and Consultant to Brunel University

Len Adams
Honorary Professor Associate, Brunel University and Senior Consultant to Spur Electron

Publication date: February 2002
500 pages, 3 halftones, 160 line figures
Hardback
ISBN: 0-19-850733-X
Retail Price $185.00 plus shipping

Now only $US137.00, ICS Electronics Company special price
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This revised second edition of a popular handbook for engineers describes the important relationship between high-energy radiation environments, electronic device physics and materials. It is a straightforward account of the problems which arise when high-energy radiation bombards matter and of engineering methods for solving those problems. Radiation effects are a problem encountered in the use of highly engineered materials such as semiconductors, optics and polymers. The finely-tuned properties of these materials may change drastically when exposed to a radiation environment such as a beam of X-rays or electrons, the space environment or the 'hadrons' in CERN's new collider. All of these environments and several more are described. At the core of this book is a discussion of the impact of these environments on the devices used in computing, data processing and communication. While unashamedly oriented to the engineer-designer and manager, with descriptions in a highly readable form, there is no compromise in physical accuracy in the description of high-energy radiation and the effects it produces, such as electronic failure, coloration and the decay of strength. A great breadth of technical data, such as may be needed to make quick decisions, is presented, with literature references and a compendium of websites which have been tested and used by the authors.

Review from the First Edition: "Compiled by two highly experienced researchers … Advanced scientific training is not required for understanding the material … Excellent collection of references for each of the 15 chapters." quoted from "Choice"

Contents (new topics in bold)

• Radiation
• Physics and Measurement
• Radiation Environments (including human risks from the terrestrial environment
• Response of Materials and Devices to Radiation including defect cascades
• Metal- Oxide-Semiconductor (MOS) Devices including dual dielectrics
• Bipolar Transistors
• Diodes, Solar Cells, Optoelectronics
• Power Devices
• Optical Media including colour centres
• Polymers and Organics including electronic films
• Shielding
• Computer Methods
• Radiation Testing
• Radiation-Hardening of Parts
• Equipment and Hardness Assurance
• Appendices: Useful general and geophysical data
• Useful radiation data including Ci-Bq chart
• Useful data on materials
• Bibliography of RADFET dosimetry
• New depth-dose curves for typical satellite orbits
• Degradation in polymers
• Compendium of Websites
• Over 500 new references

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