Single Event Effects in Aerospace

Dr. Edward Petersen

ISBN: 978-0-470-76749-8
Hardcover
520 Pages
October 2011, Wiley-IEEE Press
US MSRP $135.00

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This book introduces the basic concepts necessary to understand Single Event phenomena which could cause random performance errors and catastrophic failures to electronics devices. As miniaturization of electronics components advances, electronics components are more susceptible in the radiation environment. The book includes a discussion of the radiation environments in space and in the atmosphere, radiation rate prediction depending on the orbit to allow electronics engineers to design and select radiation tolerant components and systems, and single event prediction.

Table of Contents

  1. Introduction.
  2. Foundation of Single Event Analysis and Prediction.
  3. Optimizing Heavy Ion Experiments for Analysis.
  4. Optimizing Proton Testing.
  5. Data Qualification and Interpretation.
  6. Analysis of various types of SEU data.
  7. Cosmic Ray Single Event Rate Calculations.
  8. Proton Single Event Rate Calculations.
  9. Neutron induced upset.
  10. Upsets produced by heavy ion nuclear reactions.
  11. Samples of Heavy Ion Rate Prediction.
  12. Samples of Proton rate predictions.
  13. Combined Environments.
  14. Samples of Solar events and extreme situations.
  15. Upset Rates in Neutral Particle Beam (NPB) environments.
  16. Predictions and Observations of SEU Rates in Space.
  17. Limitations of the IRPP approach.
  18. Appendices.
  19. References.

Author Information

EDWARD PETERSEN, PhD, worked for the Naval Research Laboratory from 1969 to 1993. Since then, he has served as a consultant. Dr. Petersen's research has focused on estimating upset rates for satellite systems. His work has shown that measurements of space upset rates are consistent with predictions based on laboratory experiments. He has authored or coauthored sixty papers on radiation effects, the majority dealing with single event effects. An IEEE Fellow, Dr. Petersen was the recipient of the IEEE Nuclear and Plasma Sciences Society Radiation Effects Award.


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Introductory Price only $US110.00. US Shipping FREE. Contact ICS for expedited and international shipping rates.